Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The ordering in thin films of symmetric diblock copolymers of polystyrene and poly(methyl methacrylate) has been investigated by neutron reflectivity as a function of film thickness and temperature. The order‐disorder transition in the thin films was found to lose its first order character in that the transition occurs in a continuous manner without the correlation length becoming infinite. In addition, a transition from a partially to fully ordered state was observed which was fully reversible. This transition depended in a power law manner on the film thickness and extrapolates to the bulk order‐disorder transition temperature for thick films. Copyright © 1992 Hüthig & Wepf Verlag
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Revanth Kodoru, Atanu Saha, et al.
arXiv
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008