Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
We present a brief introduction to three reliability engineering techniques: failure mode, effects, and criticality analysis; reliability block diagrams; and fault tree analysis. We demonstrate the use of one of these techniques, reliability block diagrams, in evaluating the availability of information technology (IT) systems through a case study involving an IT system supported by a three-tier Web-server configuration. © Copyright 2008 by International Business Machines Corporation.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
John M. Boyer, Charles F. Wiecha
DocEng 2009
Limin Hu
IEEE/ACM Transactions on Networking
Raghu Krishnapuram, Krishna Kummamuru
IFSA 2003