Timing characterization of Multiple Timing Domains

Abstract

Commonly used timing measurement tools are often limited to probing a circuit running at one single frequency. In reality, multiple frequencies may be present on chip, and that can lead to timing problems which render the chip inoperable within certain frequency ranges. We will describe a simple modification to a Picosecond Imaging Circuit Analysis (PICA) instrumentation which permits the simultaneous measurement of timing in multiple frequency domains.