Yasunao Katayama
IEEE TNANO
Review
Trends in semiconductor memories
Abstract
Despite their great market success, DRAMs have not kept pace with microprocessor improvements, so researchers are looking to advanced high-speed DRAM and merged DRAM/logic technologies to increase memory system performance.
Related
Conference paper
OE device integration for optically enabled MCM
Yoichi Taira, Hidetoshi Numata, et al.
ECTC 2007
Yasunao Katayama
GLOBECOM 2019
Yasunao Katayama, Yasushi Negishi, et al.
IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems