Physical Review Letters

Review

13 Mar 1989

Two-level systems in the mechanical properties of silicon at low temperatures

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Abstract

A Comment on the Letter by Kleiman, Phys. Rev. Lett. 59, 2079 (1987). © 1989 The American Physical Society.

Paper

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Special Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated Electronics

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