J.E. Demuth, N.J. DiNardo, et al.
Physical Review B
Paper
Ultrahigh-vacuum sample transfer device with low-temperature capability
Abstract
The design of a novel sample transfer device for use in surface studies in an ultrahigh-vacuum environment is discussed. The principle feature of this design is a broad sample temperature range (∼32-∼1270 K).
Related
J.E. Demuth, D.W. Jepsen, et al.
Solid State Communications
N.J. DiNardo, J.E. Demuth, et al.
JVSTA
D. Schmeisser, J.E. Demuth, et al.
Physical Review B