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Scheduling of transactions for system-level test-case generation
R. Emek, Y. Naveh
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Paper
Universal distribution of transparencies in highly conductive Nb/AlOx/Nb junctions
Abstract
Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.
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