Indranil R. Bardhan, Sugato Bagchi, et al.
JMIS
Automatic generation of test programs plays major role in the verification of modern processors and hardware systems. In this paper, we formulate the generation of test programs as a constraint satisfaction problem and develop techniques for dealing with the challenges we face, most notably: huge variable domains (e.g., magnitude of 264) and the need to randomly generate "well distributed" samplings of the solution space. We describe several applications of our method, which include specific test generators targeted at various parts of a design or stages of the verification process.
Indranil R. Bardhan, Sugato Bagchi, et al.
JMIS
Fan Zhang, Junwei Cao, et al.
IEEE TETC
Inbal Ronen, Elad Shahar, et al.
SIGIR 2009
Maciel Zortea, Miguel Paredes, et al.
IGARSS 2021