William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Automatic generation of test programs plays major role in the verification of modern processors and hardware systems. In this paper, we formulate the generation of test programs as a constraint satisfaction problem and develop techniques for dealing with the challenges we face, most notably: huge variable domains (e.g., magnitude of 264) and the need to randomly generate "well distributed" samplings of the solution space. We describe several applications of our method, which include specific test generators targeted at various parts of a design or stages of the verification process.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
Ziyang Liu, Sivaramakrishnan Natarajan, et al.
VLDB
Sabine Deligne, Ellen Eide, et al.
INTERSPEECH - Eurospeech 2001