Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Automatic generation of test programs plays major role in the verification of modern processors and hardware systems. In this paper, we formulate the generation of test programs as a constraint satisfaction problem and develop techniques for dealing with the challenges we face, most notably: huge variable domains (e.g., magnitude of 264) and the need to randomly generate "well distributed" samplings of the solution space. We describe several applications of our method, which include specific test generators targeted at various parts of a design or stages of the verification process.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Fan Jing Meng, Ying Huang, et al.
ICEBE 2007
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
Thomas M. Cover
IEEE Trans. Inf. Theory