P. Alnot, D.J. Auerbach, et al.
Surface Science
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
P. Alnot, D.J. Auerbach, et al.
Surface Science
Ellen J. Yoffa, David Adler
Physical Review B
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics