Conference paper
Isotropic treatment of EMF effects in advanced photomasks
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
A famous theorem of Ryser asserts that a v × v zero-one matrix A satisfying AAT = (k - λ)I + λJ with k ≠ λ must satisfy k + (v - 1)λ = k2 and ATA = (k - λ)I + λJ; such a matrix A is called the incidence matrix of a symmetric block design. We present a new, elementary proof of Ryser's theorem and give a characterization of the incidence matrices of symmetric block designs that involves eigenvalues of AAT. © Elsevier Science Inc., 1997.
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
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