Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
We consider the problem of implementing a wait-free regular register from storage components prone to Byzantine faults. We present a simple, efficient, and self-contained construction of such a register. Our construction utilizes a novel building block, called a 1-regular register, which can be efficiently implemented from Byzantine fault-prone components. © 2006 Elsevier B.V. All rights reserved.
Pradip Bose
VTS 1998
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997