Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
The existing theory of the weak-localization correction to resistance in the case of short metallic wires is discussed to obtain some new physical insights. A new theoretical formula for the commonly used four-terminal geometry is derived using the formalism proposed by Doucot and Rammal. It is shown that fits to experimental data can yield substantially different values for the electron-phase relaxation length depending on the boundary conditions imposed in the theory. © 1987 The American Physical Society.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering