PaperComponent variability as a limit in digital electronicsRobert W. KeyesJournal of Computational Electronics
PaperThe Role of Low Temperatures in the Operation of Logic CircuitryRobert W. Keyes, Erik P. Harris, et al.Proceedings of the IEEE
PaperThe effect of randomness in the distribution of impurity atoms on FET thresholdsRobert W. KeyesApplied Physics
