H. Hou, S.J. Gulding, et al.
Journal of Electron Spectroscopy and Related Phenomena
We have written bits in longitudinal media at extremely high areal densities, >100, using a focused ion beam (FIB) trimmed write head mounted on a static write/read tester. Bits were written at a track pitch of ∼100 nm and with a 62.5 transition spacing with the same trimmed write head. The bits were characterized with the head read sensor and also with magnetic force microscopy (MFM). The MFM images were analyzed with respect to transition position jitter, signal-to-noise, and track width.
H. Hou, S.J. Gulding, et al.
Journal of Electron Spectroscopy and Related Phenomena
J.A. Katine, Michael Ho, et al.
INTERMAG 2003
G. Hu, T. Thomson, et al.
Journal of Applied Physics
Margaret Best, R.B. Prime
SPIE San Diego 1992