Conference paper
Noise in magnetic tunnel junction devices
K.B. Klaassen, J.C.L. Van Peppen, et al.
Journal of Applied Physics
A simple method is described for measuring the time dependency of the magnetization reversal process in the yoke of thin-film inductive write heads. Measurement results are given for an experimental head, showing close agreement with earlier published, calculated data. © 1995 IEEE
K.B. Klaassen, J.C.L. Van Peppen, et al.
Journal of Applied Physics
Min Xiao, K.B. Klaassen, et al.
INTERMAG 2000
K.B. Klaassen, J.C.L. Van Peppen
Journal of Applied Physics
K.B. Klaassen, J.C.L. van Peppen, et al.
IEEE Transactions on Magnetics