PaperAutomatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patternsArmin Segmüller, J. Angilelo, et al.Journal of Applied Physics
PaperNeutron diffraction from small numbers of Langmuir-Blodgett monolayers of manganese stearateR.M. Nicklow, M. Pomerantz, et al.Physical Review B
PaperElectron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuumM. Eizenberg, D.A. Smith, et al.Applied Physics Letters
PaperX-ray diffraction measurement of the Jahn-Teller distortion in TmVO4Armin Segmüller, R.L. Melcher, et al.Solid State Communications