Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

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No abstract available.

Paper

Comment on "Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor-phase epitaxy" (Journal of Applied Physics (1985) 57 (249))

I.C. Noyan, Armin Segmüller

Journal of Applied Physics

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Observation of X-ray interferences on thin films of amorphous silicon

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Thin Solid Films

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High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate

M. Pomerantz, Armin Segmüller

Thin Solid Films

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Electron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuum

M. Eizenberg, D.A. Smith, et al.

Applied Physics Letters

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