PaperAutomatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patternsArmin Segmüller, J. Angilelo, et al.Journal of Applied Physics
PaperOriented growth of ultrathin tungsten films on sapphire substratesJ.H. Souk, Armin Segmüller, et al.Journal of Applied Physics
PaperSmooth and coherent layers of GaAs and AlAs grown by molecular beam epitaxyL.L. Chang, Armin Segmüller, et al.Applied Physics Letters
PaperInternal strain in elastically strained germanium and silicon - I. Longitudinal caseArmin SegmüllerPhysik der Kondensierten Materie
