Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

Abstract

No abstract available.

Paper

X-ray diffraction studies of thin films and multilayer structures

Armin Segmüller, I.C. Noyan, et al.

Progress In Crystal Growth And Characterization

Paper

Growth of epitaxial films of CdTe and (Cd,Mn)Te on GaAs substrates

T. Siegrist, Armin Segmüller, et al.

Applied Physics Letters

Paper

Epitaxial growth of YBa₂Cu₃O_7-δ thin films on LiNbO₃ substrates

S.G. Lee, G. Koren, et al.

Applied Physics Letters

Paper

PtSi contact metallurgy formed by three-temperature annealing sequences and short annealing time

Chin-An Chang, Armin Segmüller

Journal of Applied Physics

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