X-ray depth profiling of iron oxide thin films
- Michael F. Toney
- Ting C. Huang
- et al.
- 2011
- Journal of Materials Research
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69 results for T.C. Huang
Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2
- T.C. Huang
- 2005
- X‐Ray Spectrometry
Profile analysis of experimental x‐ray fluorescence spectra
- T.C. Huang
- G. Lim
- 2005
- X‐Ray Spectrometry
Recent measurements of long‐wavelength x‐rays using synthetic multilayers
- T.C. Huang
- A. Fung
- et al.
- 2005
- X‐Ray Spectrometry
Thin‐film characterization by x‐ray fluorescence
- T.C. Huang
- 2005
- X‐Ray Spectrometry
Quantitative X‐ray energy dispersive analysis with the transmission electron microscope
- R.H. Geiss
- T.C. Huang
- 2005
- X‐Ray Spectrometry
A study of X-ray reflectivity data analysis methods for thin film thickness determination
- D.T. Brower
- R.E. Revay
- et al.
- 1996
- Powder Diffraction
X-Ray Fluorescence and Reflectivity Analysis of Multiple-Layer Thin Films
- Ting C. Huang
- Wen Y. Lee
- 1995
- Analytical Sciences
Structural transitions and magnetic anisotropy in ultrathin Co wedges on Pt(111) investigated with the magneto-optical Kerr effect
- D. Weller
- A. Carl
- et al.
- 1995
- Journal of Physics and Chemistry of Solids
Magnetic and magneto-optic properties of thick face-centered-cubic Co single-crystal films
- T. Suzuki
- D. Weller
- et al.
- 1994
- Applied Physics Letters