45nm/32nm CMOS - Challenge and perspective
- Kazunari Ishimaru
- 2007
- ESSCIRC 2007
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15 results for K. Ishimaru
Extendibility of NiPt silicide contacts for CMOS technology demonstrated to the 22-nm node
- Kazuya Ohuchi
- Christian Lavoie
- et al.
- 2007
- IEDM 2007
Scalability of Direct Silicon Bonded (DSB) technology for 32nm node and beyond
- Haizhou Yin
- C.Y. Sung
- et al.
- 2007
- VLSI Technology 2007
45nm/32nm CMOS - Challenge and perspective
- Kazunari Ishimaru
- 2007
- ESSDERC 2007
SODEL FET: Novel channel and source/drain profile engineering schemes by selective Si epitaxial growth technology
- Satoshi Inaba
- Kiyotaka Miyano
- et al.
- 2004
- IEEE Transactions on Electron Devices