A Novel Scheme for Detection of Defects in III-V Semiconductors by Cathodoluminescence
- Larry M. Glassman
- Martin P. Scott
- 2019
- JES
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High resolution scanning photoluminescence characterization of semi-insulating GaAs using a laser scanning microscope
- J. Marek
- A.G. Elliot
- et al.
- 1986
- Applied Physics Letters