Electrical and structural characterization of Nb-Si thin alloy film
- F. Nava
- P.A. Psaras
- et al.
- 2011
- Journal of Materials Research
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AES and EELS study of ErSi2 and its behaviour under ion bombardment and oxygen exposure
- S. Valeri
- U. del Pennino
- et al.
- 1986
- Solid State Communications