A statistical technique for characterizing X-ray position-sensitive detectors
- E. Dufresne
- R. Brüning
- et al.
- 1995
- Nuclear Inst. and Methods in Physics Research, A
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41 results for G.Brian Stephenson
In-situ X-ray studies of organometallic vapor phase epitaxy growth
- P.H. Fuoss
- D.W. Kisker
- et al.
- 1995
- Materials Science and Engineering B
In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters
Characterization of vapor phase growth using X-ray techniques
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- Journal of Crystal Growth
Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- physica status solidi (a)
GaAs c(4×4) surface structure in organometallic vapor-phase epitaxy
- A.P. Payne
- P.H. Fuoss
- et al.
- 1994
- Physical Review B
Rapid crystallization of amorphous CoZr and FeB close to eutectic compositions
- H.E Fischer
- S Brauer
- et al.
- 1994
- Materials Science and Engineering A
X-ray-scattering analysis of surface structures produced by vapor-phase epitaxy of GaAs
- F.J. Lamelas
- P.H. Fuoss
- et al.
- 1994
- Physical Review B
In situ x-ray-scattering studies of polymorphic crystallization of metal-boron glasses
- S. Brauer
- H.E. Fischer
- et al.
- 1993
- Physical Review B
Time-resolved X-ray scattering studies of rapid crystallization of amorphous metals
- S. Brauer
- H.E. Fischer
- et al.
- 1993
- International Journal of Thermophysics