Depth-sensitive strain analysis of a W/Ta/W trilayer
- S. Malhotra
- Z. Rek
- et al.
- 1996
- MRS Fall Meeting 1996
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X-ray depth profiling of iron oxide thin films
- Michael F. Toney
- Ting C. Huang
- et al.
- 2011
- Journal of Materials Research
Summary Abstract: Analysis of Co-doped iron oxide thin films by grazing incidence x-ray diffraction
- Michael F. Toney
- Ting C. Huang
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Analysis of cobalt-doped iron oxide thin films by synchrotron radiation
- T.C. Huang
- M. Toney
- et al.
- 1987
- Thin Solid Films