Picosecond photoelectron scanning electron microscope for noncontact testing of integrated circuits
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Applied Physics Letters
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PICOSECOND ELECTRICAL PULSES FOR VLSI ELECTRONICS CHARACTERIZATION.
- J.-M. Halbout
- P.G. May
- et al.
- 1986
- TMPEO 1986