Evaluation of channel hot carrier effects in n-MOS transistors at 77 K with the charge pumping technique
- P. Heremans
- Y.-C. Sun
- et al.
- 1987
- Applied Surface Science
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.