A novel technique for measuring resistance fluctuations independently of background noise
- A.H. Verbruggen
- H. Stoll
- et al.
- 1989
- Applied Physics A Solids and Surfaces
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Correlation between 1/f noise and grain boundaries in thin gold films
- A.H. Verbruggen
- R.H. Koch
- et al.
- 1987
- Physical Review B