Model of human preattentive visual detection of edge orientation anomaliesVirginia H. BrecherRaymond Bonneret al.1991SPIE Orlando 1991
The P300: An approach to automated inspection of patterned wafersVirginia BrecherRaymond Bonneret al.1989Proceedings of SPIE 1989
The P300: A system for automatic patterned wafer inspectionByron E. DomVirginia H. Brecheret al.1988Machine Vision and Applications