Model of human preattentive visual detection of edge orientation anomalies
- Virginia H. Brecher
- Raymond Bonner
- et al.
- 1991
- SPIE Orlando 1991
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3 results for Raymond Bonner
The P300: An approach to automated inspection of patterned wafers
- Virginia Brecher
- Raymond Bonner
- et al.
- 1989
- Proceedings of SPIE 1989
The P300: A system for automatic patterned wafer inspection
- Byron E. Dom
- Virginia H. Brecher
- et al.
- 1988
- Machine Vision and Applications