Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
- A. Wucher
- H. Oechsner
- et al.
- 1989
- Thin Solid Films
Publications
5 results for A. Wucher
Relative elemental sensitivity factors in secondary neutral mass spectrometry
- A. Wucher
- F. Novak
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Angular distribution of particles sputtered from metals and alloys
- A. Wucher
- W. Reuter
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometry
- A. Wucher
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Plasma studies on the Leybold-Heraeus INA3 secondary neutral mass spectrometry system
- A. Wucher
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films