Self-consistent modeling of accumulation layers and tunneling currents through very thin oxides
- Farhan Rana
- Sandip Tiwari
- et al.
- 1996
- Applied Physics Letters
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51 results for D.A. Buchanan
Anode hole injection and trapping in silicon dioxide
- D.J. DiMaria
- E. Cartier
- et al.
- 1996
- Journal of Applied Physics
Weak fluence dependence of charge generation in ultra-thin oxides on silicon
- K.R. Farmer
- C.P. Debauche
- et al.
- 1996
- Applied Surface Science
Interface states induced by the presence of trapped holes near the silicon-silicon-dioxide interface
- D.J. DiMaria
- D.A. Buchanan
- et al.
- 1995
- Journal of Applied Physics
Volatile and non-volatile memories in silicon with nano-crystal storage
- S. Tiwari
- F. Rana
- et al.
- 1995
- IEDM 1995
Probing the limits of silicon-based nanoelectronics
- S.J. Wind
- Y. Taur
- et al.
- 1995
- MRS Spring Meeting 1995
Defects generated by Fowler-Nordheim injection in silicon dioxide films produced by plasma-enhanced chemical-vapour deposition with nitrous oxide and silane
- D. Landheer
- Y. Tao
- et al.
- 1995
- Journal of Applied Physics
Atomic hydrogen-induced degradation of thin SiO2 gate oxides
- E. Cartier
- D.A. Buchanan
- et al.
- 1995
- Journal of Non-Crystalline Solids
CMOS scaling into the 21st century: 0.1 μm and beyond
- Y. Taur
- Y. Mii
- et al.
- 1995
- IBM J. Res. Dev
Anomalous positive charge formation by atomic hydrogen exposure
- R.E. Stahlbush
- E. Cartier
- et al.
- 1995
- Microelectronic Engineering