In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films
- B. Bhushan
- V.S. Williams
- et al.
- 1988
- Journal of Tribology
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In situ microviscoelastic measurements by polarization interferometric monitoring of indentation depth
- Valorie S. Williams
- Alan L. Landesman
- et al.
- 1988
- Applied Optics