TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
- Larry Carter
- Leendert M. Huisman
- et al.
- 1985
- IEEE ITC 1985
Publications
Date
Featured collections
Popular topics
2 results for T.W. Williams
TRIM: Testability Range by Ignoring the Memory
- Larry Carter
- Leendert M. Huisman
- et al.
- 1988
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems