Universal correlations between Tc and nsm* (Carrier density over effective mass) in High-Tc cuprate cuperconductors
- Y.J. Uemura
- G.M. Luke
- et al.
- 1989
- Physical Review Letters
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Interfacial roughness in InAs/GaAs heterostructures determined by soft x-ray reflectivity
- S.C. Woronick
- B.X. Yang
- et al.
- 1989
- Journal of Applied Physics