High speed serializing/de-serializing design-for-test method for evaluating a 1 GHz microprocessor
- D. Heidel
- S. Dhong
- et al.
- 1998
- VTS 1998
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19 results for Michael J. Immediato
Low temperature 12 ns DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI-TSA 1989
Low temperature SER and noise in a high speed DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- Workshop on Low Temperature Semiconductor Electronics 1989
Experimental low temperature DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI Circuits 1989
A circuit for voltage coding synchronizing
- M.J. Immediato
- Keith A. Jenkins
- 2011
- Scanning
Electron beam testing of circuits at liquid nitrogen temperature
- Keith A. Jenkins
- M.J. Immediato
- et al.
- 2011
- Scanning
A 1.3 Gsample/s 10-tap full-rate variable-latency self-timed FIR filter with clocked interfaces
- Jose Tierno
- Alexander Rylyakov
- et al.
- 2002
- Digest of Technical Papers - IEEE International Solid-State Circuits Conference
An Experimental 5-Gb/s 16 x 16 Si-Bipolar Crosspoint Switch
- Hyun J. Shin
- Michael J. Immediato
- 1992
- IEEE Journal of Solid-State Circuits
A 12-ns Low-Temperature DRAM
- Walter H. Henkels
- Nicky C. C. Lu
- et al.
- 1989
- IEEE T-ED