Publications

2 results for D.C. Cole

Applications of image diagnostics to metrology quality assurance and process control
- - John A. Allgair
  - Victor V. Boksha
  - et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
The use of simulation in semiconductor technology development
- - D.C. Cole
  - E.M. Buturla
  - et al.
- 1990
- Solid State Electronics