Growth And Characterization Of Ultrathin Cobalt Silicide Films on Si(211) and (311)
- Julia M. Phillips
- J.C. Hensel
- et al.
- 2011
- Journal of Materials Research
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Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions
- Jon S. Martens
- Kookrin Char
- et al.
- 1993
- IEEE TAS