Scaling effect on electromigration in on-chip Cu wiring
- C.-K. Hu
- R. Rosenberg
- et al.
- 1999
- IITC 1999
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12 results for B.N. Agarwala
Stress development, intermetallic phase formation, and reaction kinetics in Co-Cr and Co-Ti thin films
- F. Faupel
- D. Gupta
- et al.
- 1990
- Journal of Applied Physics