Structural Study of Amorphous Tb-Fe-Co Films by X-ray Diffraction
- E. Matsubara
- Y. Waseda
- et al.
- 1990
- Materials Transactions, JIM
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Structural study of SiOx amorphous thin films by the grazing incidence X-ray scattering (GIXS) method
- Eiichiro Matsubara
- Kunioki Kato
- et al.
- 1996
- Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
Atomic structure analysis of amorphous tb-fe1-xcox film systems
- Yoshimine Kato
- Shinji Takayama
- et al.
- 1991
- Japanese Journal of Applied Physics