System for direct measurement of the step response of electronic devices on the picosecond time scale
- J.A. Sheridan
- D.M. Bloom
- et al.
- 1995
- Optics Letters
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2 results for D.M. Bloom
Noninvasive optical probe for detecting electrical signals in silicon IC's
- H. Heinrich
- B.R. Hemenway
- et al.
- 1988
- Review of Progress in Quantitative Nondestructive Evaluation