Variability in SOI Schottky barrier MOSFETs
- S.F. Feste
- M. Zhang
- et al.
- 2008
- ULIS 2008
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4 results for S.-L. Zhang
Electrical evaluation of high-temperature effects on gate oxide integrity in a self-aligned CoSi2 MOS process
- T.E. Karlin
- S.-L. Zhang
- et al.
- 1993
- Applied Surface Science
Stresses from solid state reactions: a simple model, silicides
- S.-L. Zhang
- F.M. d'Heurle
- 1992
- Thin Solid Films
Understanding solid phase interactions: the use of tracer isotopes
- S.-L. Zhang
- F.M. d'Heurle
- et al.
- 1991
- Applied Surface Science