Algorithms for a fast confocal optical inspection system
- A.Ravishankar Rao
- N. Ramesh
- et al.
- 1992
- WACV 1992
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4 results for Frederick Y. Wu
Fast confocal image processing for inspection
- A.Ravishankar Rao
- F.Y. Wu
- et al.
- 1992
- SPIE Aerospace Sensing 1992
Automatic defect classification for semiconductor manufacturing
- Paul B. Chou
- A. Ravishankar Rao
- et al.
- 1996
- Machine Vision and Applications
Calibration and alignmenttechniques for automated inspection of printed circuit patterns
- Arturo A. Rodriguez
- Jon R. Mandeville
- et al.
- 1991
- Industrial Metrology