HfO 2/metal stacks: Determination of energy level diagram, work functions & their dependence on metal depositionS. ZafarV. Narayananet al.2005VLSI Technology 2005
High performance FDSOI CMOS technology with metal gate and high-kBruce DorisY.-H. Kimet al.2005VLSI Technology 2005
Role of oxygen vacancies in VFB/Vt stability of pFET metals on HfO2E. CartierF.R. McFeelyet al.2005VLSI Technology 2005
Optimization of high κ gate stacks with poly-Si, FUSI and metal electrodesR. JammyV. Narayananet al.2005ISTC 2005
Electron mobility dependence of W/HFO 2 gate stacks on interfacial layer preparationA.C. CallegariP. Jamisonet al.2005ECS Meeting 2005
Poly-Si/high-k gate stacks with near-ideal threshold voltage and mobilityM.M. FrankV.K. Paruchuriet al.2005VLSI-TSA 2005
Ultra-thin SOI replacement gate CMOS with ALD TaN / high-k gate stackB. DorisB.P. Linderet al.2005VLSI-TSA 2005
A comparative study of NBTI as a function of Si substrate orientation and gate dielectrics (SiON and SiON/HfO 2)S. ZafarM. Yanget al.2005VLSI Technology 2005
Thermally robust dual-work function ALD-MN x MOSFETs using conventional CMOS process flowD.-G. ParkZ. Luoet al.2004VLSI Technology 2004
Systematic study of pFET Vt with Hf-based gate stacks with poly-Si and FUSI gatesE. CartierV. Narayananet al.2004VLSI Technology 2004