A New “Shift and Ratio” Method for MOSFET Channel-Length Extraction
- Yuan Taur
- D.S. Zicherman
- et al.
- 1992
- IEEE Electron Device Letters
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3 results for D.R. Lombardi
The influence of substrate properties on optoelectronic integrated circuits
- H.J. Hovel
- M. Albert
- et al.
- 1990
- Conference on Semi-Insulating III-V Materials 1990
Electrical and physical properties of high-Ge-content Si/SiGe p-type quantum wells
- R.A. Kiehl
- P.E. Batson
- et al.
- 1993
- Physical Review B