Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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6 results for C.W. Lai

32nm general purpose bulk CMOS technology for high performance applications at low voltage
- - F. Arnaud
  - J. Liu
  - et al.
- 2008
- IEDM 2008
Dual stress liner for high performance sub-45nm gate length SOI CMOS manufacturing
- - H.S. Yang
  - R. Malik
  - et al.
- 2004
- IEDM 2004
Performance elements for 28nm gate length bulk devices with gate first high-k metal gate
- - Jun Yuan
  - C. Gruensfelder
  - et al.
- 2010
- ICSICT 2010
Reduction of RTA-driven intra-die variation via model-based layout optimization
- - J.C. Scott
  - O. Gluschenkov
  - et al.
- 2009
- VLSI Technology 2009
A 45nm low power bulk technology featuring carbon co-implantation and laser anneal on 45°-rotated substrate
- - J. Yuan
  - V. Chan
  - et al.
- 2008
- ICSICT 2008
Interaction of middle-of-line (MOL) temperature and mechanical stress on 90nm hi-speed device performance and reliability
- - K.Y. Lim
  - V. Chan
  - et al.
- 2005
- ESSDERC 2005