FinFET external resistance analysis by extended shift-and-ratio method
- Chen Zhang
- Zuoguang Liu
- et al.
- 2018
- IEEE T-ED
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First-Principles Investigations of TiGe/Ge Interface and Recipes to Reduce the Contact Resistance
- H. Dixit
- Chengyu Niu
- et al.
- 2017
- IEEE T-ED