3D integration techniques applied to SiGe power amplifiers
- Ramana Malladi
- Alvin Joseph
- et al.
- 2008
- ECS Meeting 2008
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Low-frequency noise of 90nm nFETs: Hot-carrier degradation and deuterium effect
- M. Erturk
- R. Anna
- et al.
- 2004
- SiRF 2004
Design automation methodology and rf/analog modeling for rf CMOS and SiGe BiCMOS technologies
- David L. Harame
- Kim M. Newton
- et al.
- 2003
- IBM J. Res. Dev