Experimental result and simulation analysis for the use of pixelated illumination from source mask optimization for 22nm logic lithography processKafai LaiAlan E. Rosenbluthet al.2009SPIE Advanced Lithography 2009
Modeling polarization for Hyper-NA lithography tools and masksKafai LaiAlan E. Rosenbluthet al.2007SPIE Advanced Lithography 2007