Publications

2 results for X. Ouyang

Yield monitor for embedded-SiGe process optimization
- - Xu Ouyang
  - Shwu-Jen Jeng
  - et al.
- 2008
- ICSICT 2008
High performance 45-nm SOI technology with enhanced strain, porous low-k BEOL, and immersion lithography
- - S. Narasimha
  - K. Onishi
  - et al.
- 2006
- IEDM 2006