Publications

3 results for T.W. Williams

Iddq test: Sensitivity analysis of scaling
- - T.W. Williams
  - R.H. Dennard
  - et al.
- 1996
- IEEE ITC 1996
Iddq testing for high performance CMOS - The next ten years
- - T.W. Williams
  - R. Kapur
  - et al.
- 1996
- EDTC 1996
Iddq testing for high performance CMOS - the next ten years
- - T.W. Williams
  - R. Kapur
  - et al.
- 1996
- EDTC 1996