200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- H. Jäderström
- Yu. Murin
- et al.
- 2008
- Physical Review C - Nuclear Physics
Publications
4 results for N. Olsson
A detector system for studying nuclear reactions relevant to Single Event Effects
- Yu. Murin
- Yu. Babain
- et al.
- 2007
- Nucl. Instrum. Methods Phys. Res
Inverse kinematics studies of intermediate-energy reactions relevant for SEE and medical problems
- J. Aichelin
- Ch. Bargholtz
- et al.
- 2004
- ND 2004
Single-event upsets in microelectronics
- Henry H.K. Tang
- Nils Olsson
- 2003
- MRS Bulletin