Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- Xiaobin Yuan
- Jae-Eun Park
- et al.
- 2007
- IIRW 2007
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3 results for Enhai Zhao
Substrate bias effects in vertical SiGe HBTs fabricated on CMOS-compatible thin film SOI
- Tianbing Chen
- Marco Bellini
- et al.
- 2005
- BCTM 2005
Gate-induced-drain-leakage current in 45-nm CMOS technology
- Xiaohin Yuan
- Jae-Eun Park
- et al.
- 2008
- IEEE T-DMR