Publications

3 results for Dave Albert

SRAM Single Bit Cell Soft Failure and Nano-probing Methods
- - Zhigang Song
  - Michael Tenney
  - et al.
- 2024
- ISTFA 2024
Case Study of Advanced Diagnostic Techniques for Multi Port Register File
- - Uma Srinivasan
  - William Huott
  - et al.
- 2019
- NATW 2019
Advanced fault localization through the use of tester based diagnostics with LVI, LVP, CPA and PEM
- - Laura Safran
  - John Sylvestri
  - et al.
- 2013
- ISTFA 2013